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Figure 9
Simulated (A, B) and measured (C) log-normalized diffraction patterns from four 20 µm-thick [{\hat{\bf x}}_{\rm l}]–[{\hat{\bf y}}_{\rm l}] grain slices of α-quartz (SiO2). The diffraction pattern was integrated over a 10° sample rotation interval and is displayed with increasing levels of magnification in columns A, B and C, with the full tiled detector depicted in A1, B1 and C1. Diffraction peaks present in the true measured data which are only captured after the introduction of a random mosaicity are marked with circles. Diffraction peaks present in the simulated data but missing in the measurements are marked with squares.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 1| February 2023| Pages 282-292
https://doi.org/10.1107/S1600576722011001
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