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Figure 1
A typical SFX experiment at the European XFEL, producing bursts of X-ray pulses at a megahertz repetition rate, repeating at 10 Hz frequency. Note that the diffraction from the sample is measured using an adaptive gain integrating pixel detector (AGIPD), which is capable of measuring up to 3520 pulses per second at megahertz frame rates (Wiedorn et al., 2018BB45).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 1| February 2023| Pages 200-213
https://doi.org/10.1107/S1600576722011748
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