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Figure 3
Two SRM 674b CeO2 XRD patterns shown with and without the 2θ shift caused by a speci­men displacement of −3.30 mm in the integration parameters when the speci­men-to-detector distance is 1426.71 mm and the wavelength is 0.1847 Å (67.1231 keV). The inset shows three reflections, i.e. 111, 511 and 066, in which a larger shift is seen as 2θ increases (up to 45°).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 1| February 2023| Pages 160-166
https://doi.org/10.1107/S1600576722011360
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