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Figure 5
CeO2 unit-cell parameters at 25°C at several displacement locations with corrections from the internal reference material and equation (1)[link]. `Original' used integration parameters from an external CeO2 XRD scan at the start of the experiment, `Corrected–Internal RM' used integration parameters from the internal SRM 674b CeO2, and `Corrected–Eq. 1[link]' used equation (1)[link] during the Rietveld refinement step. Both corrections were accurate, but the internal RM correction had higher precision than equation (1)[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 1| February 2023| Pages 160-166
https://doi.org/10.1107/S1600576722011360
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