view article
Figure 10
Neutron reflectivity profiles of a DMPC bilayer at 310 K deposited onto a silicon wafer by vesicle rupture under different isotopic solvent contrasts. Red D2O, blue CM4, green CMSi, yellow H2O and black lines: fitted data. Data are offset for clarity. The lower panel shows the residuals between the data and fits normalized to Q4. (Inset) The corresponding real-space SLD profile.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 1| February 2023| Pages 18-25
https://doi.org/10.1107/S160057672201086X
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS