Spatz: the time-of-flight neutron reflectometer with vertical sample geometry at the OPAL research reactor

Le Brun, A.P.; Huang, T.-Y.; Pullen, S.; Nelson, A.R.J.; Spedding, J.; Holt, S.A.

doi:10.1107/S160057672201086X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 8
Neutron reflectivity profiles of a silicon wafer in D₂O (red) and H₂O (blue) and the simultaneous fits (black lines). The lower panel shows the residuals between the data and fits normalized to Q⁴. (Inset) The corresponding real-space SLD profiles.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 1| February 2023| Pages 18-25

https://doi.org/10.1107/S160057672201086X

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