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Figure 4
Simulated patterns for exfoliated–restacked MoS2. From top to bottom: ordered (black trace), stacking faults only (red), correlated displacement only (green), best fit to the data with correlated displacement only (orange), fitting with both types of disorder (i.e. stacking faults and correlated displacement, blue).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 502-509
https://doi.org/10.1107/S1600576723001589
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