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Figure 1
(a) Initial and (b) post-mortem SEM images of the 3.5 × 3.5 × 10.5 µm micropillar MP3.5 deformed at the Cristal beamline. The highest applied stress on the pillar was 570 MPa. (c) The scattering geometry with a scattering angle of 2θ = 22°, top view, where ki and kf are the incident and scattered wavevectors, respectively. The diffraction condition is [{\bf G}_{11\bar{1}} = {\bf k}_{\rm f}-{\bf k}_{\rm i}]. The pixelated detector is positioned perpendicularly to kf.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 381-390
https://doi.org/10.1107/S1600576723000493
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