In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints

Godard, P.; Verezhak, M.; Sadat, T.; Mignerot, F.; Jacques, V.L.R.; Le Bolloc'h, D.; Richter, C.; Berenguer, F.; Diaz, A.; Van Petegem, S.; Renault, P.-O.; Thilly, L.

doi:10.1107/S1600576723000493

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
SEM images of the micropillar MP′₂, 2 × 2 × 6 µm, studied with nano-diffraction at ID01, (a) before and (b) after deformation. The highest applied stress on the pillar was 610 MPa. The pillar axis is $[[\bar{2}\bar{1}\bar{3}]]$ .

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 2| April 2023| Pages 381-390

https://doi.org/10.1107/S1600576723000493

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