In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints

Godard, P.; Verezhak, M.; Sadat, T.; Mignerot, F.; Jacques, V.L.R.; Le Bolloc'h, D.; Richter, C.; Berenguer, F.; Diaz, A.; Van Petegem, S.; Renault, P.-O.; Thilly, L.

doi:10.1107/S1600576723000493

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
Integrated diffraction intensities of the micropillar MP′′₂, characterizing (a) the elastic strain, (b) the twist and (c) the bending around $[[\bar{4}51]]$ . The direction q_x, parallel to $[[\bar{4}51]]$ , is probed with energy scans, while q_2θ and q_z are the horizontal and vertical directions on the detector, respectively. Furthermore, u′′₀ is before any loading, while u′′₁ and u′′₂ are after applied stresses of 130 and 190 MPa, respectively. The horizontal and vertical scales are adapted for each part. (d) The diffraction pattern associated with u′′₀.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 2| April 2023| Pages 381-390

https://doi.org/10.1107/S1600576723000493

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