addenda and errata\(\def\hfill{\hskip 5em}\def\hfil{\hskip 3em}\def\eqno#1{\hfil {#1}}\)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

Specimen-displacement correction for powder X-ray diffraction in Debye–Scherrer geometry with a flat area detector. Erratum

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aMaterials Science and Engineering, University of Illinois at Urbana-Champaign, 1304 W. Green St., Urbana, Illinois 61801, USA
*Correspondence e-mail: kriven@illinois.edu

Edited by H. Brand, Australian Synchrotron, ANSTO, Australia (Received 20 February 2023; accepted 20 February 2023; online 21 March 2023)

An error in Fig. 2(b) in the paper by Hulbert & Kriven [J. Appl. Cryst. (2023), 56, 160–166] is corrected.

In the article by Hulbert & Kriven (2023[Hulbert, B. S. & Kriven, W. M. (2023). J. Appl. Cryst. 56, 160-166.]), there is an error in Fig. 2(b) which shows the Bragg–Brentano geometry for an X-ray diffraction (XRD) experiment. The arc denoting the angle 2θ + δ was mistakenly drawn so that it ended at the base of the specimen. However, it should extend to the incident beam. The revised Fig. 2(b) diagram is given here, shown in Fig. 1[link]. Both the derived equation and the conclusions in the original article are unaffected by this figure correction.

[Figure 1]
Figure 1
Revised diagram showing Bragg–Brentano XRD geometry. The original figure (Hulbert & Kriven, 2023[Hulbert, B. S. & Kriven, W. M. (2023). J. Appl. Cryst. 56, 160-166.]) showed the angle 2θ + δ drawn incorrectly.

Funding information

The following funding is acknowledged: National Science Foundation, Directorate for Materials Research (grant No. 1838595 to WMK).

References

First citationHulbert, B. S. & Kriven, W. M. (2023). J. Appl. Cryst. 56, 160–166.  CrossRef CAS IUCr Journals Google Scholar

This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
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