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Figure 1
Top-view SE micrographs of samples A–D. The scale bar is common to all micrographs.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 439-448
https://doi.org/10.1107/S1600576723001486
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