view article
Figure 4
Measured intensity profiles (circles) along lines of constant qx marked by the dashed lines in Fig. 3[link] and the respective fits (lines) for samples (a) A and (b) B. The measured intensity is fitted to the sum of two Gaussians, a narrow one representing the scattering from the NWs and a broader one due to scattering from the rough substrate. The background is assumed to depend linearly on qz.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 439-448
https://doi.org/10.1107/S1600576723001486
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS