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Figure 6
(a) GISAXS intensities I(qx) for samples A–D, presented as products I(qx) qx4 (open symbols) and the respective Monte Carlo simulations (lines). The measurements were performed for three different azimuthal orientations ψ of the incident X-ray beam with respect to the side facets of the NWs. (b) Examples of the cross sections of NWs used in the simulation of each sample. The scale bar is common for all samples.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 439-448
https://doi.org/10.1107/S1600576723001486
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