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Figure 11
Real and Laplace stress depth profiles determined by fitting the σ∥(τ) function to the optimized [\sigma_{\parallel} (\tau_{0}^{hkl})] distribution shown in Fig. 10[link](a). See text for details.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 526-538
https://doi.org/10.1107/S1600576723001759
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