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Figure 7
Evaluation of the residual stress depth profile for the circumferential stress component σϕϕ and of the grain interaction model. (a) Minimization of the total path length [\Sigma_{\Delta}^{(r)}] required to connect the individual values [\sigma_{\phi\phi} (\tau_{0}^{hkl})] [see equation (13[link])]. (b) DEC [{1 \over 2} S_{2}^{hkl}] of austenitic steel calculated for different grain interaction models (single-crystal elastic constants taken from Landoldt–Börnstein tables; Hellwege, 1984BB27). (c)–(e) Discrete Laplace stress depth profiles calculated for different grain interaction models. See text for further details.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
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