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Figure 8
(a) Real and Laplace stress depth profiles determined by fitting the σϕϕ(τ) function to the discrete [\sigma_{\phi\phi} (\tau_{0}^{hkl})] data in Fig. 7[link](d). (b) Normalized lattice parameters obtained from the sin2ψ regression lines (Fig. 6[link]) in the strain-free directions [\psi^{*,hkl}] = [\arcsin (-2S^{hkl}_{1}/{1 \over 2} S^{hkl}_{2})^{1/2}] of the biaxial residual stress state, fitted by a linear function.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 526-538
https://doi.org/10.1107/S1600576723001759
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