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Figure 7
(a) A 303[\bar 3]0 back-reflection topograph along a mixed-type MP. Growth striations indicate the deformation, with the resulting tilt and strain in the surrounding lattice around the MP's core. (b) A model of a single mixed-type MP separated into screw and edge components, which leads to a separation into subordinate diffracted intensity maxima in an RSM, corresponding to the MP's edge and screw dislocation parts. The path of the screw dislocation part is parallel to the main growth direction in [0001] and the edge dislocation part propagates in the (0001) basal plane. X-ray diffraction is also possible close to the MP core at the same angle as for undisturbed lattice planes, and the difference between the edge and screw dislocation parts can be quantified.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 3| June 2023| Pages 776-786
https://doi.org/10.1107/S1600576723003291
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