CyRSoXS: a GPU-accelerated virtual instrument for polarized resonant soft X-ray scattering

Saurabh, K.; Dudenas, P.J.; Gann, E.; Reynolds, V.G.; Mukherjee, S.; Sunday, D.; Martin, T.B.; Beaucage, P.A.; Chabinyc, M.L.; DeLongchamp, D.M.; Krishnamurthy, A.; Ganapathysubramanian, B.

doi:10.1107/S1600576723002790

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 14
Comparisons of analytical and simulation line-cut integration for (a) 2D and (b) 3D line gratings. The q_x component of q is at the location of the first-order peak.

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 3| June 2023| Pages 868-883

https://doi.org/10.1107/S1600576723002790

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