Implementation of grain mapping by diffraction contrast tomography on a conventional laboratory tomography setup with various detectors

Fang, H.; Ludwig, W.; Lhuissier, P.

doi:10.1107/S1600576723003874

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 12
Illustration of CNR determination for the spot 1 $[\overline 1]$ $[\overline 1]$ at ω = 288° from grain 25 [see its CNR values for spot 1 in Fig. 7

(a)] in images measured by the flat panel detector with an exposure time of (a) 4 s, (b) 20 s, (c) 60 s, (d) 120 s and (e) 360 s. Left column: a forward spot overlaid onto the experimental image; middle column: region masked by the forward spot to identify the experimental spot; right column: region to determine background noise. Note that another smaller diffraction spot is present at the lower-left corner of the spot of interest, the spots being partially overlapped with each other.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 3| June 2023| Pages 810-824

https://doi.org/10.1107/S1600576723003874

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