EDP2PDF: a computer program for extracting a pair distribution function from an electron diffraction pattern for the structural analysis of materials

Liu, H.; Nomoto, K.; Ceguerra, A.V.; Kruzic, J.J.; Cairney, J.; Ringer, S.P.

doi:10.1107/S1600576723004053

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 10
The effect of thickness on the SNIP method for background subtraction. (a) A coloured thickness map of the amorphous silica thin film. (b)–(d) ZLPs for the different thickness areas A, B and C, annotated with the ratios of MFPs. (e), (g) and (i) EDPs of the areas A, B and C, respectively. (f), (h) and (j) SNIP processing on the extracted diffraction intensity profiles for each area.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 3| June 2023| Pages 889-902

https://doi.org/10.1107/S1600576723004053

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