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Figure 8
(a) The electron diffraction pattern, (b) the extracted diffraction intensity profile and its noise-filtered pattern, and (c) the corresponding PDF and the normalized PDF of the glassy silica sample. Note that the peaks in the PDF are identical to the Si—O, O—O and second Si—O bonding distances with increasing length order in direct space.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 3| June 2023| Pages 889-902
https://doi.org/10.1107/S1600576723004053
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