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Figure 2
Schematic diagrams of the in situ combined multi-field measurement utilizing XRD and digital image correlation. (a) The angular XRD measurement setup in the Oxz plane. (b) An illustration of the DIC setup in the Oyz plane.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 3| June 2023| Pages 750-763
https://doi.org/10.1107/S160057672300331X
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