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Figure 2
The experimental setup on the I16 beamline at Diamond Light Source. The detector is positioned perpendicular to the incident beam and parallel to the incident polarization (top). The Model ES1500 multifunctional stress–strain system with high-voltage terminals is also shown (bottom).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1046-1050
https://doi.org/10.1107/S1600576723004120
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