view article
Figure 2
(a) Simulated rocking curve of GaAs/AlAs SL (blue), its convolution with the instrumental function (red) and the experimental data (black). (b) Cross-sectional SEM image of the corresponding SL with measured total SL thickness (tilt corrected).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 961-966
https://doi.org/10.1107/S1600576723004302
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS