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Figure 3
(a) Integrated diffracted intensity of GaAs/AlAs SL 0th-order peak in the q range 22.19 ± 2 × 10−3 nm−1 as a function of delay time between the laser pump and X-ray probe. (b) Relative photoinduced signal change in double- (green) and single-gate mode (red).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 961-966
https://doi.org/10.1107/S1600576723004302
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