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Figure 1
X-ray diffraction patterns from the sulfonated cast M1 and uniaxially deformed M0 films (a) and from the uniaxially deformed M2 film as produced and after functionalization (sulfonation), exposure to in-beam hydration and temperature treatment during SANS investigation, followed by the IEC analysis procedure (b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 947-960
https://doi.org/10.1107/S1600576723005496
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