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Figure 3
X-ray diffraction patterns from cast (a) and uniaxially deformed (b), (c) films. Patterns (a) and (b) correspond to sulfonated films while (c) corresponds to the sulfonated film in (b) after exposure to in-beam hydration and temperature treatment during SANS investigation followed by the IEC analysis procedure.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 947-960
https://doi.org/10.1107/S1600576723005496
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