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Figure 5
SANS patterns over an extended Q range from the sample M1 exposed to different RH states and temperatures (as indicated on the right side of the plot). Data collected on different detector banks in TOF mode at the TAIKAN instrument are depicted as follows: light-coloured symbols – SA, strong-coloured symbols – HA. The scattering features indicated by the roman numbers have the same meaning as in Fig. 3[link]. The inset shows the SANS data measured at 303 K and RH = 85% over different detection banks in parallel with the XRD data collected at a powder diffractometer. The resolution in different Q ranges is also indicated.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 947-960
https://doi.org/10.1107/S1600576723005496
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