view article
Figure 6
SANS patterns measured in TOF mode at TAIKAN from the sample M2 in different contrast conditions as exposed to different RH/T conditions and averaged over the equatorial sectors. The RH and T conditions are indicated in the legend. The main plot (a) presents the full patterns measured over a wide Q range by combining different detection banks, while the inset (b) depicts the WANS patterns in parallel with the XRD scattering pattern measured with a powder diffractometer before the SANS characterization. The arrow in the inset (b) indicates the ionomer peak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 947-960
https://doi.org/10.1107/S1600576723005496
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS