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Figure 2
(a) Beamline injection setup surrounding the mixing-HVE device inside the helium-purged sample chamber at the SPB/SFX instrument and (b) in the laboratory test station during in-air operation.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1038-1045
https://doi.org/10.1107/S1600576723004405
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