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Figure 1
(a) A comparison between the recorded intensities of the Maxipix (1 s exposure) and CITIUS (0.1152 s exposure) detectors when a Siemens star sample is exposed to the direct beam of the ID01 source. The images shown are the sum total of the recorded counts across 401 frames of a ptychography scan. White pixels are located at the gaps of the Maxipix detector. A small portion of the upper left quadrant of the CITIUS sensor is masked, where hot pixels were seen to occur. Inset for each detector is a single frame of the ptychography scan. Histograms are provided (b) for the noise, taken for one frame over 20 × 20 pixels far from the illuminated area, and (c) for the observed counts per pixel over the full detector.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1032-1037
https://doi.org/10.1107/S1600576723004314
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