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Figure 1
Two-dimensional diffraction patterns from the P02.1 beamline at PETRA III at a high-angular-resolution sample-to-detector distance of 2200 mm for samples with 0.8, 2.1, 9.1 and 50.0 µm grain size (top row). Magnification of the 200 reflection for the different grain sizes (bottom row). The sample with a grain size of 50.0 µm additionally exhibits electrode reflections, marked with a red arrow. The transparent red region indicates the opening window of the MAD during a 2θ scan.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1242-1251
https://doi.org/10.1107/S1600576723005940
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