view article
Figure 14
Through-thickness stress profiles of the specimens (a) H0° and (b) H45°; the uncorrected layer removal data are combined with neutron diffraction, assuming symmetry of the layer removal depth profiles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1076-1090
https://doi.org/10.1107/S1600576723004855
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS