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Figure 8
Through-thickness (T) RS profiles obtained by incremental electrolytic layer removal at the center of the side surface (L ≃ 55 mm, BD ≃ 6.5 mm) [see Fig. 2[link](e)] for the specimens (a) H0° and (b) H45°. No stress relaxation corrections were applied. To guide the reader's eye, data smoothing has been performed in OriginLab by the locally weighted least-squares (lwlsq) method.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1076-1090
https://doi.org/10.1107/S1600576723004855
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