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Figure 8
Experimental data from a nanostructured block copolymer film. (a) AFM height image. The scale bar and the height scale are given. (b) Measured 2D GISAXS pattern. The logarithmic intensity scale is given on the right. The black stripes are detector gaps. Arrows indicate the calculated position of the specularly reflected beam (S), specularly diffuse scattering (D), the critical angles calculated for the substrate (αc,sub) and the film (αc,film) delimiting the Yoneda band Y [for details see Jung et al. (2021BB31)], vertical scattering rods (R), and a scattering peak below the Yoneda band (P).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 5| October 2023| Pages 1330-1347
https://doi.org/10.1107/S1600576723006520
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