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![[Figure 1]](iu5039fig1mag.jpg)
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Figure 1
(a) A Φ scan of silicon reflection 222. Synchrotron X-rays of 8 keV, σ polarization. Peaks related by the sixfold symmetry of the [111] rotation axis have opposite line profile asymmetries, like the highlighted peaks (insets). (b) Graphical indexing of MD peaks by Bragg cone lines, where MD events are excited at the intersection of BC lines. The horizontal solid black line at ω = 29.76° denotes the BC line of reflection 222, while the red/blue lines indicate secondary reflections in the diffraction geometries g = 1 (red) and g = −1 (blue). The sense of sample rotation is clockwise with the 222 diffraction vector pointing to the observer. |
![[Figure 1]](iu5039fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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