Journal of Applied Crystallography
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Figure 2
Model structure of a silicon crystal with electronic charges placed at the covalent bonds. Structure factors were computed using the atomic scattering factors of the Si
4+
ion for the atomic sites and hydrogen for each electron in the bonds.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56
|
Part 5
|
October 2023
|
Pages 1574-1584
https://doi.org/10.1107/S1600576723005800
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.