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Figure 4
(a) The phase shift Δδ of structure factors F = |F|exp(iδ) regarding two ASN model structures. Q is the Bragg reflection diffraction-vector modulus. Only reflections with Δδ > 5° (vertical pins) are shown. (b) Predicted MD events with line-profile asymmetry flipping, i.e. where cos(Ψ)cos(Ψ + ΔΨ) < 0 (vertical pins), in the Φ scan of the reference reflection G = 026. W is the relative value of |FHFG–H| and Q refers to the secondary reflections H. ΔΨ is the triplet phase shift between the two model structures.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 5| October 2023| Pages 1574-1584
https://doi.org/10.1107/S1600576723005800
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