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Figure 8
ASN 026 Φ scans collected in-house (rotating anode) and on the EMA beamline (synchrotron). For flux below 1011 ph s−1 mm−2, no changes in the MD line profiles were observed after 12 h of continuous exposure. A rapid increase in sample mosaicity and loss of sharpness of profile asymmetry occur for flux above 1013 ph s−1 mm−2, as can be seen from the first scan collected at time instant t = 0, when exposure to this high flux begins, to the last one collected 75 min later. (Bottom panel) A graphic of BC lines and indexed secondary reflections H.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 5| October 2023| Pages 1574-1584
https://doi.org/10.1107/S1600576723005800
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