view article
Figure 1
(a) A schematic diagram of Laue diffraction geometry. C is the crystal. O is the perpendicular foot of C on the imaging detector plane. D is the imaging distance from C to O. The Xf axis is along the opposite direction to x′. LauePt allows the detector to be rotated around x′ by an angle Φ ([-180 \ll \Phi \ll 180^\circ]). [Φ = 90° corresponds to the reflection geometry widely used in Laue microdiffraction where the X-ray imaging detector is placed above the crystal (Gürsoy et al., 2022BB7; Ulrich et al., 2011BB19), while Φ = 180° corresponds to the forward transmission geometry.] (b) Crystal rotation along the diffraction vector G without affecting the diffracted wavevector kg.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 5| October 2023| Pages 1610-1615
https://doi.org/10.1107/S1600576723007926
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS