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Figure 5
The LUT-T search and pattern simulation of a β-Ga2O3 crystal. (a) Recorded back-reflection Laue image of the crystal. (b) Ten reflection triplets obtained from the LUT-T search for spots A, B, C in panel (a) and the matching simulation based on the valid solution (110, [{\overline 1} 10]). Imaging distance D = 45.8 mm, Hmax = Kmax = Lmax = 5 and Δθ = 0.1°. Image width 112 mm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 5| October 2023| Pages 1610-1615
https://doi.org/10.1107/S1600576723007926
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