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Figure 5
Secondary-electron FESEM images from samples (a), (b) S1, (c) S52 and (d) S51. Images were collected at magnifications of (a) 10 000×, (b) 100 000×, (c) 40 000× and (d) 80 000×. In (a), the white arrow highlights a rare micrometric pore. The red box denotes the position of magnification (b) in (a). In (b), green arrows display nanometric pores of irregular shape. In (a), the black bar denotes the scale. The red bars represent the scale in (b), (c) and (d).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 6| December 2023| Pages 1692-1706
https://doi.org/10.1107/S1600576723008889
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