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Figure 3
Film thickness determined by Laue fringes (inset) as a function of deposition time, shown as an example for the growth of the NiFe2O4 film. There is a linear correlation between film thickness and deposition time. This observation is representative for the growth of all films. The inset shows the fitted Laue oscillations (red), and the derived distance ΔL was used to determine the film thickness df.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 6| December 2023| Pages 1784-1791
https://doi.org/10.1107/S1600576723009287
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