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Figure 7
Comparison of the two fitting methods used for the determination of layer distances, shown for the NiFe2O4 film. The expected bulk values for MgO, Fe3O4, NiFe2O4 and NiO at the deposition temperature of 526 K are indicated by dashed lines. The inset shows a schematic representation of the interpolation by fitting the oscillations with Gaussians (red line) and calculating the mid-point of symmetrically equivalent fringes.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 6| December 2023| Pages 1784-1791
https://doi.org/10.1107/S1600576723009287
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