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Figure 8
(a) Evolution of the lateral (crosses) and vertical (circles) layer distances for different Ni contents, determined by fitting of (113)NFO for films with an Ni content up to x = 1. The layer parameters for the overstoichiometric films (x > 1) were taken from the interpolation of the (222)NFO Laue fringes. (b) The lateral and vertical layer distances for different Ni contents at a film thickness of df = 8.25 (7) nm. The expected bulk values for FeO, MgO, Fe3O4, NiFe2O4 and NiO at the deposition temperature of 523 K are indicated by dashed lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 6| December 2023| Pages 1784-1791
https://doi.org/10.1107/S1600576723009287
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