Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 12
A histogram of the interference visibilities, (right)
o
state and (left)
h
state. The interferometer is perfectly aligned. The manufacturing tolerance is
u
= 2 µm. The parameters used in the Monte Carlo simulations are given in Table 1
.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 1
|
February 2024
|
Pages 44-59
https://doi.org/10.1107/S1600576723010245
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