Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 2
The new LC Series Analysis window in
RAW
, which allows automated and manual selection of buffer and sample ranges and baseline correction and plots the
R
g
and MW values across the elution peak.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 1
|
February 2024
|
Pages 194-208
https://doi.org/10.1107/S1600576723011019
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