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Figure 2
(a) USAXS profile of the SiP dispersion. (b) Guinier plot of the scattered intensity in the lower-q region.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 1| February 2024| Pages 215-219
https://doi.org/10.1107/S1600576723011135
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