Using XAS to monitor radiation damage in real time and post-analysis, and investigation of systematic errors of fluorescence XAS for Cu-bound amyloid-β

Ekanayake, R.S.K.; Streltsov, V.A.; Best, S.P.; Chantler, C.T.

doi:10.1107/S1600576723010890

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 11
(a) Flattened and non-flattened fluorescence measurement interpretation in Mu2Chi (Schalken & Chantler, 2018

) for Cu^II:Aβ_4–16₁. k³χ(k) versus k for Cu^II:Aβ_{4–16_1,2,3}, Cu^II:Aβ_4–12₂ and Cu^II:Aβ_{4–8_1,2,3} and their fits obtained from eFEFFit (c) without and (d) with normalized measurements. The refined structural parameters of the normalized spectra were reliable and realistic.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 1| February 2024| Pages 125-139

https://doi.org/10.1107/S1600576723010890

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